[1]尹 超,周桂法,汪 旭,等.基于加速退化试验的电路板性能退化及可靠性分析[J].控制与信息技术,2018,(05):70-73.[doi:10.13889/j.issn.2096-5427.2018.05.015]
 YIN Chao,ZHOU Guifa,WANG Xu,et al.Degradation and Reliability Analysis of a Circuit Board Based on Accelerated Degradation Test[J].High Power Converter Technology,2018,(05):70-73.[doi:10.13889/j.issn.2096-5427.2018.05.015]
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基于加速退化试验的电路板性能退化及可靠性分析()
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《控制与信息技术》[ISSN:2095-3631/CN:43-1486/U]

卷:
期数:
2018年05期
页码:
70-73
栏目:
RAMS 技术
出版日期:
2018-10-05

文章信息/Info

Title:
Degradation and Reliability Analysis of a Circuit Board Based on Accelerated Degradation Test
文章编号:
2096-5427(2018)05-0070-04
作者:
尹 超周桂法汪 旭杜绍华
(中车株洲所电气技术与材料工程研究院, 湖南 株洲 412001)
Author(s):
YIN Chao ZHOU Guifa WANG Xu DU Shaohua
( CRRC ZIC Research Institute of Electrical Technology & Material Engineering, Zhuzhou, Hunan 412001, China )
关键词:
加速退化试验多应力工况退化模型平稳性检验电路板
Keywords:
accelerated degradation test multi-stress condition degradation model stability test circuit board
分类号:
TB114.3;U260.1
DOI:
10.13889/j.issn.2096-5427.2018.05.015
文献标志码:
A
摘要:
目前加速退化试验研究多针对单应力情况而开展,而产品在工作现场面临的是多种环境应力运行工况。为此,文章给出了多应力工况下产品加速退化试验的数据建模方法和分析流程,选取某型控制电路板开展温湿度综合应力加速退化试验方案的设计和实施,并首次利用时间序列分析中的平稳性检验方法进行退化趋势分析,二者结合定量评估得出该型控制板各参数在试验和现场工作条件下皆未发生退化的结论。
Abstract:
At present, accelerated degradation test research is carried out mostly for single stress condition, while the products are faced with an operating condition of many environmental stresses in the field. This paper presented a data modeling method and analysis process for accelerated degradation test under multi-stress, and designed an accelerated degradation test scheme for temperature and humidity comprehensive stress for a control circuit board. Based on the first application of stability test in time series analysis and accelerated degradation test under multi-stress condition, it can be concluded that the parameters of the control board are not degraded under both test and field conditions.

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备注/Memo

备注/Memo:
收稿日期:2018-04-02
作者简介:尹超(1990-),男,工程师,主要从事可靠性设计、可靠性试验等方面的研究工作。
更新日期/Last Update: 2018-10-18